- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Patent holdings for IPC class G01N 23/223
Total number of patents in this class: 1262
10-year publication summary
97
|
80
|
112
|
85
|
96
|
112
|
97
|
107
|
115
|
43
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Rigaku Corporation | 379 |
96 |
Shimadzu Corporation | 5791 |
58 |
HORIBA, Ltd. | 746 |
56 |
Security Matters Ltd | 89 |
51 |
Hitachi High-Tech Science Corporation | 326 |
29 |
X-Ray Optical Systems, Inc. | 64 |
25 |
Thermo Niton Analyzers LLC | 40 |
23 |
Icagen, LLC | 38 |
22 |
Sigray, Inc. | 68 |
20 |
Soreq Nuclear Research Center | 108 |
20 |
Malvern PANalytical B.V. | 124 |
19 |
Shenzhen Xpectvision Technology Co., Ltd. | 359 |
17 |
Helmut Fischer GmbH Institut fur Elektronik und Messtechnik | 154 |
16 |
Evident Scientific, Inc. | 170 |
16 |
Nova Measuring Instruments Inc. | 59 |
14 |
Bruker Technologies Ltd. | 100 |
13 |
Thermo Scientific Portable Analytical Instruments Inc. | 114 |
10 |
Canon Anelva Corporation | 676 |
10 |
Metso Outotec Finland Oy | 795 |
9 |
Enterprise Science Fund, LLC | 141 |
9 |
Other owners | 729 |